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Spectrophotometer of series EPSILON is designed for measuring reflection and transmission spectral characteristics of plane optical parts and coatings on them in ultraviolet, visible and near infrared range. Owing to high operation speed these spectrophotometers are indispensable in QCD and test laboratories of optical production sites.
Application:
- Measurement of transmission and reflection spectra of multi-layer optical coatings in UV, visible and IR ranges.
- Determination of integral refraction and transmission indices.
- Determination of chromaticity coordinates.
Merits:
CMOS triggers-based spectrometers are used as registration instruments. Minimum measurement time of the whole spectrum is two milliseconds, which allows to get the whole spectral characteristic practically instantly.
It provides higher accuracy and stability of measurements, and excludes impact of ambient flares on measurement results.
- Built-in automatic calibration system (optional).
Instruments of series EPSILON can be complete with radiation sources Hg – Ar for checking calibration. Software includes built-in automatic calibration algorithm. This allows to make calibration of the whole spectral range with just one button push in a matter of seconds.
- Extensive service opportunities.
The instrument software includes spectra libraries for different types of glasses. The program supports formats of spectra files of programs ML (Multi-Layer), OptiLayer and other text/table files. Plots can be printed out.
- Measurement of chromaticity, integral characteristics.
The instrument software allows to evaluate coating chromaticity coordinates, integral coefficients of reflection/transmission on the selected spectrum segment.
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